atomic force Search Results


96
Carl Zeiss atomic force microscope
Atomic Force Microscope, supplied by Carl Zeiss, used in various techniques. Bioz Stars score: 96/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/atomic+force/pmc06768125-88-2-9?v=Carl+Zeiss
Average 96 stars, based on 1 article reviews
atomic force microscope - by Bioz Stars, 2026-08
96/100 stars
  Buy from Supplier

98
Oxford Instruments mfp3d atomic force microscope
Mfp3d Atomic Force Microscope, supplied by Oxford Instruments, used in various techniques. Bioz Stars score: 98/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/atomic+force/us11920042-510-11-9?v=Oxford+Instruments
Average 98 stars, based on 1 article reviews
mfp3d atomic force microscope - by Bioz Stars, 2026-08
98/100 stars
  Buy from Supplier

95
Oxford Instruments atomic force microscopy instrument
Atomic force <t>microscopy</t> (AFM) images of different UHP treated MP solutions from the scallop mantle. 3D view (A–F) and top view (A'–F') .
Atomic Force Microscopy Instrument, supplied by Oxford Instruments, used in various techniques. Bioz Stars score: 95/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/atomic+force/pmc09037751-73-9-15?v=Oxford+Instruments
Average 95 stars, based on 1 article reviews
atomic force microscopy instrument - by Bioz Stars, 2026-08
95/100 stars
  Buy from Supplier

99
Oxford Instruments atomic force microscope afm
Atomic force <t>microscopy</t> (AFM) images of different UHP treated MP solutions from the scallop mantle. 3D view (A–F) and top view (A'–F') .
Atomic Force Microscope Afm, supplied by Oxford Instruments, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/atomic+force/pmc08025740-68-8-12?v=Oxford+Instruments
Average 99 stars, based on 1 article reviews
atomic force microscope afm - by Bioz Stars, 2026-08
99/100 stars
  Buy from Supplier

90
NanoImaging Services Inc heated atomic force microscope cantilever
Atomic force <t>microscopy</t> (AFM) images of different UHP treated MP solutions from the scallop mantle. 3D view (A–F) and top view (A'–F') .
Heated Atomic Force Microscope Cantilever, supplied by NanoImaging Services Inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/atomic+force/10__1016_slash_j__mspro__2015__06__076-269-11-7?v=NanoImaging+Services+Inc
Average 90 stars, based on 1 article reviews
heated atomic force microscope cantilever - by Bioz Stars, 2026-08
90/100 stars
  Buy from Supplier

90
JPK Instruments AG forcerobot atomic force microscope
Atomic force <t>microscopy</t> (AFM) images of different UHP treated MP solutions from the scallop mantle. 3D view (A–F) and top view (A'–F') .
Forcerobot Atomic Force Microscope, supplied by JPK Instruments AG, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/atomic+force/us11111528-182-0-5?v=JPK+Instruments+AG
Average 90 stars, based on 1 article reviews
forcerobot atomic force microscope - by Bioz Stars, 2026-08
90/100 stars
  Buy from Supplier

90
NT MDT America Inc muscovite mica for atomic force microscopy (afm)
Atomic force <t>microscopy</t> (AFM) images of different UHP treated MP solutions from the scallop mantle. 3D view (A–F) and top view (A'–F') .
Muscovite Mica For Atomic Force Microscopy (Afm), supplied by NT MDT America Inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/atomic+force/pm15009674-50-0-10?v=NT+MDT+America+Inc
Average 90 stars, based on 1 article reviews
muscovite mica for atomic force microscopy (afm) - by Bioz Stars, 2026-08
90/100 stars
  Buy from Supplier

90
NT MDT America Inc n-doped silicon cantilevers nsg01
Atomic force <t>microscopy</t> (AFM) images of different UHP treated MP solutions from the scallop mantle. 3D view (A–F) and top view (A'–F') .
N Doped Silicon Cantilevers Nsg01, supplied by NT MDT America Inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/atomic+force/10__1002_slash_aenm__202100666-315-17-21?v=NT+MDT+America+Inc
Average 90 stars, based on 1 article reviews
n-doped silicon cantilevers nsg01 - by Bioz Stars, 2026-08
90/100 stars
  Buy from Supplier

90
NanoMagnetics Instruments Ltd afm nanomagnetics
Atomic force <t>microscopy</t> (AFM) images of different UHP treated MP solutions from the scallop mantle. 3D view (A–F) and top view (A'–F') .
Afm Nanomagnetics, supplied by NanoMagnetics Instruments Ltd, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/atomic+force/10__1103_slash_physreve__100__020702-72-1-2?v=NanoMagnetics+Instruments+Ltd
Average 90 stars, based on 1 article reviews
afm nanomagnetics - by Bioz Stars, 2026-08
90/100 stars
  Buy from Supplier

90
Dynasil Inc atomic force microscopy afm
Measurement techniques used in the study. ( a ) Optical <t>microscopy.</t> The white and blue arrows indicate the strain directions relative to the long lengths of the wires used in the study. The characteristic crack spacing is indicated by λ . ( b ) Scanning electron microscopy (SEM)—the crack width f is visible. The inset shows a depth profile of a crack. ( c ) Atomic force microscopy (AFM) was used to measure the evaporated film thickness and uniformity. ( d ) Optical interference microscopy was used to produce non-contact, large surface tomography of cracking and buckling. ( e ) Piezoresistance characterization via current-voltage ( IV ) measurements using a probe station. The inset shows how the IV changes with applied strain.
Atomic Force Microscopy Afm, supplied by Dynasil Inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/atomic+force/pmc06015027-50-13-7?v=Dynasil+Inc
Average 90 stars, based on 1 article reviews
atomic force microscopy afm - by Bioz Stars, 2026-08
90/100 stars
  Buy from Supplier

90
PT Tempo Scan atomic force microscopy (afm)
Measurement techniques used in the study. ( a ) Optical <t>microscopy.</t> The white and blue arrows indicate the strain directions relative to the long lengths of the wires used in the study. The characteristic crack spacing is indicated by λ . ( b ) Scanning electron microscopy (SEM)—the crack width f is visible. The inset shows a depth profile of a crack. ( c ) Atomic force microscopy (AFM) was used to measure the evaporated film thickness and uniformity. ( d ) Optical interference microscopy was used to produce non-contact, large surface tomography of cracking and buckling. ( e ) Piezoresistance characterization via current-voltage ( IV ) measurements using a probe station. The inset shows how the IV changes with applied strain.
Atomic Force Microscopy (Afm), supplied by PT Tempo Scan, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/atomic+force/10__1021_slash_ma501632t-3-13-28?v=PT+Tempo+Scan
Average 90 stars, based on 1 article reviews
atomic force microscopy (afm) - by Bioz Stars, 2026-08
90/100 stars
  Buy from Supplier

90
NT MDT America Inc lab-built confocal microscope integrated with an atomic force microscope ntegra
Measurement techniques used in the study. ( a ) Optical <t>microscopy.</t> The white and blue arrows indicate the strain directions relative to the long lengths of the wires used in the study. The characteristic crack spacing is indicated by λ . ( b ) Scanning electron microscopy (SEM)—the crack width f is visible. The inset shows a depth profile of a crack. ( c ) Atomic force microscopy (AFM) was used to measure the evaporated film thickness and uniformity. ( d ) Optical interference microscopy was used to produce non-contact, large surface tomography of cracking and buckling. ( e ) Piezoresistance characterization via current-voltage ( IV ) measurements using a probe station. The inset shows how the IV changes with applied strain.
Lab Built Confocal Microscope Integrated With An Atomic Force Microscope Ntegra, supplied by NT MDT America Inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/atomic+force/10__1016_slash_j__carbon__2018__02__102-61-11-21?v=NT+MDT+America+Inc
Average 90 stars, based on 1 article reviews
lab-built confocal microscope integrated with an atomic force microscope ntegra - by Bioz Stars, 2026-08
90/100 stars
  Buy from Supplier

Image Search Results


Atomic force microscopy (AFM) images of different UHP treated MP solutions from the scallop mantle. 3D view (A–F) and top view (A'–F') .

Journal: Frontiers in Nutrition

Article Title: Physicochemical Properties and in vitro Digestibility of Myofibrillar Proteins From the Scallop Mantle ( Patinopecten yessoensis ) Based on Ultrahigh Pressure Treatment

doi: 10.3389/fnut.2022.873578

Figure Lengend Snippet: Atomic force microscopy (AFM) images of different UHP treated MP solutions from the scallop mantle. 3D view (A–F) and top view (A'–F') .

Article Snippet: The morphology of the MP was monitored by the atomic force microscopy instrument (MFP-3D infinity, Oxford Instruments Ltd., UK) through a previously described method with slight modifications ( ).

Techniques: Microscopy

Measurement techniques used in the study. ( a ) Optical microscopy. The white and blue arrows indicate the strain directions relative to the long lengths of the wires used in the study. The characteristic crack spacing is indicated by λ . ( b ) Scanning electron microscopy (SEM)—the crack width f is visible. The inset shows a depth profile of a crack. ( c ) Atomic force microscopy (AFM) was used to measure the evaporated film thickness and uniformity. ( d ) Optical interference microscopy was used to produce non-contact, large surface tomography of cracking and buckling. ( e ) Piezoresistance characterization via current-voltage ( IV ) measurements using a probe station. The inset shows how the IV changes with applied strain.

Journal: Scientific Reports

Article Title: Cracking effects in squashable and stretchable thin metal films on PDMS for flexible microsystems and electronics

doi: 10.1038/s41598-018-27798-z

Figure Lengend Snippet: Measurement techniques used in the study. ( a ) Optical microscopy. The white and blue arrows indicate the strain directions relative to the long lengths of the wires used in the study. The characteristic crack spacing is indicated by λ . ( b ) Scanning electron microscopy (SEM)—the crack width f is visible. The inset shows a depth profile of a crack. ( c ) Atomic force microscopy (AFM) was used to measure the evaporated film thickness and uniformity. ( d ) Optical interference microscopy was used to produce non-contact, large surface tomography of cracking and buckling. ( e ) Piezoresistance characterization via current-voltage ( IV ) measurements using a probe station. The inset shows how the IV changes with applied strain.

Article Snippet: The thickness, roughness, and uniformity of the evaporated metal films were measured using atomic force microscopy (AFM)—see Fig. (see Supplementary Table ).

Techniques: Microscopy, Electron Microscopy, Tomography