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Oxford Instruments
atomic force microscopy instrument ![]() Atomic Force Microscopy Instrument, supplied by Oxford Instruments, used in various techniques. Bioz Stars score: 95/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more https://www.bioz.com/product/atomic+force/pmc09037751-73-9-15?v=Oxford+Instruments Average 95 stars, based on 1 article reviews
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Oxford Instruments
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NanoImaging Services Inc
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JPK Instruments AG
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NT MDT America Inc
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NT MDT America Inc
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NanoMagnetics Instruments Ltd
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PT Tempo Scan
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NT MDT America Inc
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Image Search Results
Journal: Frontiers in Nutrition
Article Title: Physicochemical Properties and in vitro Digestibility of Myofibrillar Proteins From the Scallop Mantle ( Patinopecten yessoensis ) Based on Ultrahigh Pressure Treatment
doi: 10.3389/fnut.2022.873578
Figure Lengend Snippet: Atomic force microscopy (AFM) images of different UHP treated MP solutions from the scallop mantle. 3D view (A–F) and top view (A'–F') .
Article Snippet: The morphology of the MP was monitored by the
Techniques: Microscopy
Journal: Scientific Reports
Article Title: Cracking effects in squashable and stretchable thin metal films on PDMS for flexible microsystems and electronics
doi: 10.1038/s41598-018-27798-z
Figure Lengend Snippet: Measurement techniques used in the study. ( a ) Optical microscopy. The white and blue arrows indicate the strain directions relative to the long lengths of the wires used in the study. The characteristic crack spacing is indicated by λ . ( b ) Scanning electron microscopy (SEM)—the crack width f is visible. The inset shows a depth profile of a crack. ( c ) Atomic force microscopy (AFM) was used to measure the evaporated film thickness and uniformity. ( d ) Optical interference microscopy was used to produce non-contact, large surface tomography of cracking and buckling. ( e ) Piezoresistance characterization via current-voltage ( IV ) measurements using a probe station. The inset shows how the IV changes with applied strain.
Article Snippet: The thickness, roughness, and uniformity of the
Techniques: Microscopy, Electron Microscopy, Tomography